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Research on Classification Method for Small Target and Low Contrast Paper Defects Based on Improved YOLOv7 |
Received:September 07, 2024 |
DOI:10.11980/j.issn.0254-508X.2025.03.018 |
Key Words:classification of paper defects small target YOLOv7 SPPFCPS SimAM |
Fund Project:国家自然科学基金(62073206);西安市科技计划项目(2020KJRC0146)。 |
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Abstract:As the speed and width of the paper machine increasing, the frequency of paper defects rises accordingly. To effectively eliminate these defects, accurate classification is required for tracing their sources. However, due to the small size and low contrast of some paper defects, classification results are suboptimal. This paper proposed a classification method based on an improved YOLOv7 model. The core idea of the methodology was that the neck network improved the spatial pyramid pooling with fast cross stage partial connections (SPPFCSPC), it improved classification speed without changing the receptive field. Space-to-depth non-strided convolution was used to replace the original “convolution + pooling layer” to enhance the feature extraction capability for paper defects. Additionally, by utilizing the similarity-based attention module (SimAM) directed more resources to paper defects details, thereby boosting recognition efficiency for low contrast and small target defects. The results showed that this algorithm attained a mean precision of 0.97 with real-time detection speed of 26.5 frames/s. Compared to YOLOv7, this method significantly improved both the mean precision and detection speed for small target and low contrast paper defects. |
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