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Light Source Optimization Scheme for Paper Defect Detection System Based on the Uniform Illumination of the Near-field
Received:November 14, 2019  
DOI:10.11980/j.issn.0254-508X.2020.03.009
Key Words:paper defect detection  machine vision  uniform illumination  light source optimization  uniform gray scale
Fund Project:陕西省教育厅自然专项(17JK0645);陕西省科技统筹创新工程计划项目(2016KTCQ01-35);陕西省重点科技创新团队计划(2014KCT-15)。
Author NameAffiliationPostcode
FENG Bo College of Electrical and Control Engineering Shaanxi University of Science & Technology,Xi'an, Shaanxi Province,710021
Haojing Collage of Shaanxi University of Science & Technology,Xi'an, Shaanxi Province, 712046)
(*E-mail:wtang 906@163.com 
712046
TANG Wei College of Electrical and Control Engineering Shaanxi University of Science & Technology,Xi'an, Shaanxi Province,710021 710021
SHAN Wenjuan College of Electrical and Control Engineering Shaanxi University of Science & Technology,Xi'an, Shaanxi Province,710021 710021
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Abstract:The image collected in the paper defect detection system has lateral gray unevenness. Based on the theory of geometrical optical irradiance, this paper studied the application technology concerning the uniform distribution of illuminance on the paper detected by the light source module of the paper defect detection system. According to the Sparrow's criterion, the optimal distance function between the LED beads in the light source module was determined. From the perspective of machine vision, the power optimization function of the LED beads at different positions in the light source array was determined by experimental method. The improvement effect of the light source was verified by using the image gray uniformity index. The experimental results showed that the optimization scheme could increase the gray uniformity of the acquired image to 98.6%, which was greatly improved compared with 57.8% before optimization, effectively improved the image quality of the paper and reduced the difficulty of image processing in the later stage, which was expected to improve the execution efficiency of the application program.
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